1. 1) P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley and M. I. Whelan: Electron Microscopy of Thin Crystals, Krieger, Florida, (1977), 415–433.
2. 2) A. Tonomura: Electron holography, second edition, Springer-Verlag, Berlin, (1999), 78–82.
3. 3) D. Shindo and T. Oikawa: Advanced Analytical Electron Microscopy for Materials Characterization, Kyoritsu Press (in Japanese), Tokyo, (1998), 70–73.
4. 4) R. F. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, sencond edition Plenum Press, New York, (1996), 301–307.
5. 5) D. Gabor: Nature, London, 161 (1948), 777.