Micro-Electro-Mechanical System Fourier Transform Infrared (MEMS FT-IR) Spectrometer Under Modulated–Pulsed Light Source Excitation
Author:
Affiliation:
1. Faculty of Engineering, Ain-Shams University, Cairo, Egypt
2. Transmission Department, National Telecommunication Institute, Cairo, Egypt
3. Si-Ware Systems, Cairo, Egypt
Abstract
Publisher
SAGE Publications
Subject
Spectroscopy,Instrumentation
Link
http://journals.sagepub.com/doi/pdf/10.1177/0003702819886091
Reference17 articles.
1. On the Ultimate Sensitivity and Practical Performance of Radiation Detectors
2. MEMS-based microspectrometer technologies for NIR and MIR wavelengths
3. Wideband Optical MEMS Interferometer Enabled by Multimode Interference Waveguides
4. High-speed broadband FTIR system using MEMS
5. On-Chip Micro–Electro–Mechanical System Fourier Transform Infrared (MEMS FT-IR) Spectrometer-Based Gas Sensing
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