Van Der Pauw method for measuring resistivities of anisotropic layers printed on textile substrates

Author:

Kazani Ilda1,De Mey Gilbert2,Hertleer Carla1,Banaszczyk Jedrzej2,Schwarz Anne1,Guxho Genti3,Van Langenhove Lieva1

Affiliation:

1. Ghent University, Department of Textiles, Technologiepark, Zwijnaarde, Belgium.

2. Ghent University, Department of Electronics and Information Systems, Sint-Pietersnieuwstraat, Gent, Belgium.

3. Polytechnic University of Tirana, Department of Textile and Fashion, Square ‘Mother Teresa’, Tirana, Albania.

Abstract

Electrically conducting layers have been screen printed on woven textile substrates. Using the Van Der Pauw method for electrical resistivity measurements in thin layers, it was observed that the screen-printed layers showed anisotropic behavior. In order to be able to interpret the measurements correctly, a mathematical analysis of the measuring method has been established. From the experimental results one is then able to find the relation between the electrical resistivity in the warp versus the weft direction.

Publisher

SAGE Publications

Subject

Polymers and Plastics,Chemical Engineering (miscellaneous)

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