Affiliation:
1. Department of Engineering, University of Warwick, Coventry CV4 7AL, UK
Abstract
The problem of instrument calibration for nanotechnological applications is discussed, with particular reference to the establishment of standards based upon easily reproduced natural parameters such as the lattice spacing of a homogeneous crystal. The successful application of X-ray interferometry using silicon crystals to the measurement of displacement down to 5 picometres is discussed, and further possibilities for its use in instrument calibration in the nanotechnological regime are considered.
Subject
Applied Mathematics,Control and Optimization,Instrumentation
Cited by
1 articles.
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