α-spectrum estimation for 1/f processes in noisy environments

Abstract

In the past, 1/ f noise was regarded as a stochastic process that accords with Gaussian distribution. According to our studies, the output transistor 1/ f noise can be characterized more accurately as non-Gaussian α-stable distribution rather than Gaussian distribution. We define and consistently estimate the samples normalized cross-correlations of linear S αS processes and propose a samples normalized cross-correlations–based α-spectrum method effective in noisy environments. Simulation results and diodes noise spectrum estimation results exhibit good performance.