Temperature Distributions in Hollow Cathode Emitters
Author:
Affiliation:
1. Jet Propulsion Laboratory
2. Northrup Grumman Space Technologies
3. International Space University
Publisher
American Institute of Aeronautics and Astronautics
Link
http://arc.aiaa.org/doi/pdf/10.2514/6.2004-4116
Reference15 articles.
1. J.E. Polk, D. Brinza, R.Y. Kakuda, J.R. Brophy, I. Katz, J.R. Anderson, V.K. Rawlin, M.J. Patterson, J.Sovey,andJ.Hamley. DemonstrationoftheNSTARIonPropulsionSystemontheDeepSpaceOne Mission. In27thInternationalElectricPropulsionConference,Pasadena,CA,2001. IEPC-01-075.
2. T.R. Sarver-Verhey. 28,000 Hour Xenon Hollow Cathode Life Test Results. In 25thInternational Electric PropulsionConference, Cleveland, OH, 1997. IEPC97-168.
3. T.R.Sarver-Verhey. DestructiveEvaluationofaXenonHollowCathodeAftera28,000HourLifeTest. In34rdJointPropulsionConference,Cleveland,OH,1998. AIAA-98-3482.
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