Physics based Degradation Modeling and Prognostics of Electrolytic Capacitors under Electrical Overstress Conditions
Author:
Affiliation:
1. Stinger Ghaffarian Technologies, Inc.
2. NASA Ames Research Center
3. Vanderbilt University
Publisher
American Institute of Aeronautics and Astronautics
Link
http://arc.aiaa.org/doi/pdf/10.2514/6.2013-5137
Reference35 articles.
1. 2FIDESGroup,“ReliabilityMethodologyforElectronicSystems,”FIDESGuideissueA,2004.
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