Failure Analysis on Diode-triggered Silicon-Controlled Rectifiers By using Nondestructive X-ray Microscopy-Reference-Cited by-同舟云学术

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Failure Analysis on Diode-triggered Silicon-Controlled Rectifiers By using Nondestructive X-ray Microscopy

Published:2021-09-15 Issue: Volume: Page:
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Container-title:2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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Author:

Chen Xinqian,Jin Mengge,Feihou ,Liang Fang,Zhang Zijian,Wang Yanan,Liu Dongming,Chen Le,Wang Chaolun,Liu Zhiwei,Wu Xing

Funder

Science and Technology Commission of Shanghai Municipality

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9617229/9617230/09617299.pdf?arnumber=9617299

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanoscale Analysis of Breakdown Induced Crack Propagation in DTSCR Devices;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

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