Study of the local electrical properties of metal surfaces using an AFM with a conducting probe-Reference-Cited by-同舟云学术

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Study of the local electrical properties of metal surfaces using an AFM with a conducting probe

Published:1998-03 Issue:1 Volume:21 Page:76-81
ISSN:1070-9886
Container-title:IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
language:
Short-container-title:IEEE Trans. Comp., Packag., Manufact. Technol. A

Author:

Schneegans O.,Houze F.,Meyer R.,Boyer L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering

Link

http://xplorestaging.ieee.org/ielx4/95/14928/00679036.pdf?arnumber=679036

Cited by 32 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Multiscale Theoretical Analysis of the Mechanical, Thermal, and Electrical Characteristics of Rough Contact Interfaces Demonstrating Fractal Behavior;Frontiers in Mechanical Engineering;2020-07-01

2. Adhesion and Mechanical Properties of PDMS-Based Materials Probed with AFM: A Review;REVIEWS ON ADVANCED MATERIALS SCIENCE;2018-05-01

3. Full-wave modeling of broadband near field scanning microwave microscopy;Scientific Reports;2017-11-22

4. High-speed atomic force microscopy for materials science;International Materials Reviews;2016-06-14

5. Membranes: Atomic Force Microscopy;Encyclopedia of Surface and Colloid Science, Third Edition;2015-12-04

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