An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory-Reference-Cited by-同舟云学术

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An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory

Published:2013-03 Issue:3 Volume:48 Page:864-877
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Chang Meng-Fan,Shen Shin-Jang,Liu Chia-Chi,Wu Che-Wei,Lin Yu-Fan,King Ya-Chin,Lin Chorng-Jung,Liao Hung-Jen,Chih Yu-Der,Yamauchi Hiroyuki

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/6466407/06407149.pdf?arnumber=6407149

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