Novel Outlier-Robust Accelerated Degradation Testing Model and Lifetime Analysis Method Considering Time-Stress-Dependent Factors-Reference-Cited by-同舟云学术

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Novel Outlier-Robust Accelerated Degradation Testing Model and Lifetime Analysis Method Considering Time-Stress-Dependent Factors

Published:2024-08 Issue:8 Volume:20 Page:9907-9917
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Li Yang¹^ORCID,Fei Minrui¹^ORCID,Jia Li¹^ORCID,Lu Ningyun²^ORCID,Kaynak Okyay³^ORCID,Zio Enrico⁴^ORCID

Affiliation:

1. School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China

2. College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China

3. Department of Electrical and Electronics Engineering, Bogaziçi University, Istanbul, Türkiye

4. MINES ParisTech, PSL Research University, Paris, France

Funder

National Natural Science Foundation of China

China Postdoctoral Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/9424/10623532/10510192.pdf?arnumber=10510192

Reference27 articles.

1. Cycle Life Evaluation Based on Accelerated Aging Testing for Lithium-Ion Capacitors as Alternative to Rechargeable Batteries

2. Model Uncertainty in Accelerated Degradation Testing Analysis

3. A Random Fuzzy Accelerated Degradation Model and Statistical Analysis

4. Modeling Accelerated Degradation Data Based on the Uncertain Process

5. Unbiased parameters estimation and mis-specification analysis of Wiener process-based degradation model with random effects

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1. Dynamic weight-based accelerated test modeling for fault degradation and lifetime analysis;Reliability Engineering & System Safety;2024-12

2. Federated Learning With Potential Partnership Identification for Accurate Prediction in Flexible Manufacturing System;IEEE Transactions on Reliability;2024

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