33.1 A Fully Integrated GaN-on-Silicon Gate Driver and GaN Switch with Temperature-compensated Fast Turn-on Technique for Improving Reliability
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IEEE
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http://xplorestaging.ieee.org/ielx7/9365732/9365735/09365828.pdf?arnumber=9365828
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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5. A GaN-on-Si Gate Driver with 14.7X Reduction in Tailing Current Loss and 37.0% Reduction of Reverse Conduction Loss;2023 IEEE Custom Integrated Circuits Conference (CICC);2023-04
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