Application of displacement damage dose analysis to low-energy protons on silicon devices
Author:
Affiliation:
1. SFA Inc., Largo, FL, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx5/23/25186/01134205.pdf?arnumber=1134205
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