In-NVRAM Unified PUF and TRNG Based on Standard CMOS Technology
Author:
Affiliation:
1. The University of Electro-Communications (UEC),Tokyo,Japan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10181241/10181318/10181362.pdf?arnumber=10181362
Reference13 articles.
1. Recommendation for the Entropy Sources Used for Random Bit Generation;barker;Tech Rep,2018
2. NIST Special Publication 800-22: A Statistical Test Suite for the Validation of Random Number Generators and Pseudo Random Number Generators for Cryptographic Applications;rukhin;NIST Special Publication 800-22,2010
3. A Unified NVRAM and TRNG in Standard CMOS Technology
4. A Stable Physically Unclonable Function Based on a Standard CMOS NVR
5. A Robust and Healthy Against PVT Variations TRNG Based on Frequency Collapse
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1. A Unified OTP and PUF Exploiting Post-Program Current on Standard CMOS Technology;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19
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