A self-tuning controller for high-performance scanning tunneling microscopy
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8052581/8062426/08062448.pdf?arnumber=8062448
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Kalman Filter-Based Estimation of Surface Conductivity and Surface Variations in Scanning Tunneling Microscopy;IEEE Transactions on Control Systems Technology;2024-07
2. Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography;IEEE Control Systems;2024-02
3. Kalman Filter Based Estimation of Surface Conductivity in STM;2022 IEEE Conference on Control Technology and Applications (CCTA);2022-08-23
4. İkinci derece zaman gecikmeli modeller için kesir dereceli oransal-integral denetleyici tasarımında analitik yaklaşım;Gazi Üniversitesi Mühendislik-Mimarlık Fakültesi Dergisi;2021-05-09
5. A new approach to removing H atoms in hydrogen depassivation lithography;Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020;2020-03-23
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