Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring-Reference-Cited by-同舟云学术

Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring

Published:2024-08 Issue:8 Volume:71 Page:1948-1955
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Slipukhin Ivan¹^ORCID,Coronetti Andrea¹^ORCID,Alía Rubén García¹^ORCID,Saigné Frédéric²,Boch Jérôme²^ORCID,Dilillo Luigi³^ORCID,Aguiar Ygor Q.¹^ORCID,Cazzaniga Carlo⁴^ORCID,Kastriotou Maria⁴^ORCID,Dodd Torran⁴

Affiliation:

1. CERN, Geneva, Switzerland

2. Institute d’Électronique et des Systémes, Université de Montpellier, Montpellier, France

3. Institute d’Électronique et des Systémes, Université de Montpellier, CNRS, Montpellier, France

4. ISIS Facility, U.K. Research Innovation (UKRI)-Science and Technology Facilities Council (STFC), Swindon, U.K.

Funder

European Union’s Horizon 2020 Research and Innovation Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/23/10638256/10587020.pdf?arnumber=10587020

Reference24 articles.

1. Estimation of System Survival Reliability in a Radiation Environment Based on the Available Radiation Data at Component Level

2. Qualification of electronic components for a radiation environment: When standards do not exist;Uznanski

3. LHC and HL-LHC: Present and Future Radiation Environment in the High-Luminosity Collision Points and RHA Implications

4. Radiation Hardness Assurance Methodology of Radiation Tolerant Power Converter Controls for Large Hadron Collider

5. First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics