A Comparison of Total-Ionizing-Dose Effects in Silicon and Silicon-Nitride Waveguides-Reference-Cited by-同舟云学术

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A Comparison of Total-Ionizing-Dose Effects in Silicon and Silicon-Nitride Waveguides

Published:2024-08 Issue:8 Volume:71 Page:1798-1806
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Ringel Brett L.¹^ORCID,Teng Jeffrey W.¹^ORCID,Hosseinzadeh Mozhgan¹^ORCID,Sam Delwyn G.¹,Francis Peter J.¹^ORCID,Parameswaran Hari¹^ORCID,Little Arielle²^ORCID,Tzintzarov George N.²^ORCID,Monahan Daniele M.²^ORCID,LaLumondiere Stephen D.²^ORCID,Cressler John D.¹^ORCID

Affiliation:

1. School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA

2. The Aerospace Corporation, El Segundo, CA, USA

Funder

United States Government

National Defense Science and Engineering Graduate (NDSEG) Fellowship

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/23/10638256/10559642.pdf?arnumber=10559642

Reference54 articles.

1. Long-Haul Analog Photonics

2. Microwave Photonics

3. CMOS Photonics for High-Speed Interconnects

4. Optical millimeter-wave generation or up-conversion using external modulators

5. Relay-assisted free-space optical communication

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