Quantization-Robust On-Chip Jitter Measurement Technique for Multiple Local Oscillator Systems
Author:
Affiliation:
1. Institut für Nanotechnologie,Karlsruher Institut für Technologie (KIT),Karlsruhe,Germany
2. Intel Germany,Munich,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10557746/10557828/10558206.pdf?arnumber=10558206
Reference12 articles.
1. 13.2 A digital multimode polar transmitter supporting 40MHz LTE Carrier Aggregation in 28nm CMOS
2. Low-Jitter Frequency Generation Techniques for 5G Communication: A tutorial
3. Electrical noise as a reliability indicator in electronic devices and components
4. A 16-nm FinFET Power- and Phase Noise-Scalable DCO using On-Chip Tapped Inductor
5. A Self-Calibrated On-Chip Phase-Noise Measurement Circuit With $-$75 dBc Single-Tone Sensitivity at 100 kHz Offset
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