Role of back-side indium tin oxide on the degradation mechanism of silicon heterojunction solar cells
Author:
Affiliation:
1. University of Delaware,Department of Electrical and Computer Engineering,Newark,DE,USA,19716
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9938432/9938453/09938791.pdf?arnumber=9938791
Reference13 articles.
1. Evidence for a Light‐Induced Degradation Mechanism at Elevated Temperatures in Commercial N‐Type Silicon Heterojunction Solar Cells
2. Electroluminescence analysis for spatial characterization of parasitic optical losses in silicon heterojunction solar cells
3. Aluminum-induced degradation and failure mechanisms of a-Si:H solar cells
4. Degradation and failure mechanisms of a-Si:H solar cells with aluminum contacts
5. Performance of Silicon Heterojunction Photovoltaic modules in Qatar climatic conditions
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