High-Frequency EM Characterization of Through-Wall Building Imaging-Reference-Cited by-同舟云学术

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High-Frequency EM Characterization of Through-Wall Building Imaging

Published:2009-05 Issue:5 Volume:47 Page:1375-1387
ISSN:0196-2892
Container-title:IEEE Transactions on Geoscience and Remote Sensing
language:
Short-container-title:IEEE Trans. Geosci. Remote Sensing

Author:

Chang P.C.,Burkholder R.J.,Volakis J.L.,Marhefka R.J.,Bayram Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Earth and Planetary Sciences,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/36/4815947/04810144.pdf?arnumber=4810144

Cited by 37 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhanced Scattering from Cylindrical Structures in the Presence of SPP Waves;Plasmonics;2023-11-25

2. Solving Electromagnetic Inverse Scattering Problems in Inhomogeneous Media by Deep Convolutional Encoder–Decoder Structure;IEEE Transactions on Antennas and Propagation;2023-03

3. Analysis of the Scattering of Surface Plasmon Polariton Waves from a Perfectly Conducting Circular Cylinder;Plasmonics;2021-09-11

4. Through-the-Wall Microwave Imaging: Forward and Inverse Scattering Modeling;Sensors;2020-05-18

5. The Cylindrical Wave Approach for the Electromagnetic Scattering by Targets behind a Wall;Electronics;2019-11-01

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