Measurement of Circuit Parasitics of SiC MOSFET in a Half-Bridge Configuration
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Science, Bangalore, India
Funder
Ministry of Electronics and Information Technology
NAMPET III
Design and Development of WBG Device based High Current Converters for Industry Applications
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/9803836/09779471.pdf?arnumber=9779471
Reference25 articles.
1. Measurement of important circuit parasitics for switching transient analysis of SiC MOSFET and Schottky diode pair
2. Probing techniques for accurate voltage measurements on power supplies with oscilloscopes,2019
3. Parasitic Inductance and Capacitance-Assisted Active Gate Driving Technique to Minimize Switching Loss of SiC MOSFET
4. Characterization of power electronics system interconnect parasitics using time domain reflectometry
5. A New Characterization Technique for Extracting Parasitic Inductances of SiC Power MOSFETs in Discrete and Module Packages Based on Two-Port S-Parameters Measurement
Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Detailed Analytical Switching Transient Model for Silicon Superjunction MOSFET and SiC Schottky Diode Pair;IEEE Transactions on Power Electronics;2024-10
2. A Novel 4H-SiC SGT MOSFET with Improved P+ Shielding Region and Integrated Schottky Barrier Diode;Micromachines;2024-07-22
3. Measurement of Circuit Parasitics of a 200kW SiC based Stack;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25
4. Energy-based Method to Estimate the Partial Hard Turn-on Loss of Complementary SiC MOSFET from Experiment;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25
5. Focuses and Concerns of Dynamic Test for Wide Bandgap Device: A Questionnaire-Based Survey;IEEE Transactions on Power Electronics;2023-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3