A Fast ON-State Voltage Measurement Circuit for Power Devices Characterization
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/9687117/09623477.pdf?arnumber=9623477
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Online Prediction Method for the Remaining Useful Life of Power Devices Based on Composite Indicator;IEEE Transactions on Power Electronics;2024-08
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3. A Flexible Setup for Dynamic On-State Resistance Measurements of GaN HEMTs With One-Factor-at-a-Time Capability;IEEE Transactions on Power Electronics;2024-06
4. Accurate Extraction of Body-Diode-Conduction for Synchronous Rectification of CLLC Resonant Converters in High-Voltage Application;IEEE Transactions on Power Electronics;2024-05
5. On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation Processes Investigated by a Novel Experimental Approach;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
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