Characteristics of High-$T_{\rm c}$ Josephson Junction Fabricated by Focused Ion Beam and Ion Damage-Reference-Cited by-同舟云学术

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Characteristics of High-$T_{\rm c}$ Josephson Junction Fabricated by Focused Ion Beam and Ion Damage

Published:2009-06 Issue:3 Volume:19 Page:210-213
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Chiu-Hsien Wu ,Wei-Cheng Kuo ,Yu-Te Chou ,Jau-Han Chen ,Hong-Chang Yang

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/77/5166641/05153032.pdf?arnumber=5153032

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-TcJosephson junctions fabricated by focused ion beam direct milling;Superconductor Science and Technology;2012-12-20

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