Gallium Ion Implantation into Niobium Thin Films Using a Focused-Ion Beam-Reference-Cited by-同舟云学术

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Gallium Ion Implantation into Niobium Thin Films Using a Focused-Ion Beam

Published:2005-06 Issue:2 Volume:15 Page:3524-3527
ISSN:1051-8223
Container-title:IEEE Transactions on Appiled Superconductivity
language:en
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Datesman A.M.,Schultz J.C.,Cecil T.W.,Lyons C.M.,Lichtenberger A.W.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/77/31008/01440432.pdf?arnumber=1440432

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Magnetic field induced weak-to-strong-link transformation in patterned superconducting films;Physical Review B;2023-12-01

2. Superconducting Properties and Electron Scattering Mechanisms in a Nb Film with a Single Weak-Link Excavated by Focused Ion Beam;Materials;2021-11-28

3. Superconducting properties of NbN film, bridge and meanders;AIP Advances;2018-05

4. Influence of Fabrication Processes on Transport Properties of Superconducting Niobium Nitride Nanowires;Current Science;2018-04-10

5. Thickness Modulated Niobium Nanoconstrictions by Focused Ion Beam and Anodization;IEEE Transactions on Applied Superconductivity;2016-04

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