Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors-Reference-Cited by-同舟云学术

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Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

Published:1999-05 Issue:5 Volume:46 Page:968-974
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Angelis C.T.,Dimitriadis C.A.,Brini J.,Kamarinos G.,Gueorguiev V.K.,Ivanov T.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx4/16/16454/00760405.pdf?arnumber=760405

Cited by 26 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time Dynamics of the Down-Coupling Phenomenon in 3-D NAND Strings;IEEE Transactions on Electron Devices;2022-12

2. Study of traps in low-temperature polysilicon thin film transistors using a current transient method;Semiconductor Science and Technology;2021-11-26

3. Influence of flexible substrate in low temperature polycrystalline silicon thin-film transistors: temperature dependent characteristics and low frequency noise analysis;Nanotechnology;2020-08-03

4. Study on interface characteristics in amorphous indium–gallium–zinc oxide thin-film transistors by using low-frequency noise and temperature dependent mobility measurements;Solid-State Electronics;2015-07

5. Low-frequency noise in 2-bit poly-Si TANOS flash memory;Japanese Journal of Applied Physics;2014-12-16

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