Channel Thickness Impact on the Small- and Large-Signal RF Performance of GaN HEMTs on Si with a cGaN Back-Barrier

Author:

ElKashlan Rana1,Khaled Ahmad1,Rodriguez Raul1,Yadav Sachin1,Peralagu Uthayasankaran1,Alian AliReza1,Collaert Nadine1,Wambacq Piet1,Parvais Bertrand1

Affiliation:

1. imec,Belgium

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Large-Signal Characterisation and Analysis of AlN/GaN MISHEMTs on Si with a PAE > 62% at 28 GHz;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16

2. A Composite AlGaN/cGaN Back Barrier for mm-Wave GaN-on-Si HEMTs;ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC);2023-09-11

3. Low-Voltage Operation AlInN/GaN HEMTs on Si with High Output Power at sub-6 GHz;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11

4. Dependence of process damage on GaN channel thickness in AlGaN/GaN high-electron-mobility transistors with back-barrier layers;Japanese Journal of Applied Physics;2023-02-06

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