Compact distributed RLC interconnect models. I. Single line transient, time delay, and overshoot expressions-Reference-Cited by-同舟云学术

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Compact distributed RLC interconnect models. I. Single line transient, time delay, and overshoot expressions

Published:2000 Issue:11 Volume:47 Page:2068-2077
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Davis J.A.,Meindl J.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/18988/00877168.pdf?arnumber=877168

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