Author:
Nishimura Y.,Hamada M.,Hidaka H.,Ozaki H.,Fujishima K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
6 articles.
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1. Redundancy;Integrated Circuits and Systems;2010-11-26
2. Schreib-Lese-Speicherschaltkreise (RAM);Mikroelektronische Speicher;1992
3. Minimum fault covering in reconfigurable arrays;Integration;1991-06
4. Disjoint Covers in Replicated Heterogeneous Arrays;SIAM Journal on Discrete Mathematics;1991-05
5. An ac test structure for fast memory arrays;IBM Journal of Research and Development;1990-03