Electrical Impedance Tomography Deep Imaging With Dual-Branch U-Net Based on Deformable Convolution and Hyper-Convolution-Reference-Cited by-同舟云学术

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Electrical Impedance Tomography Deep Imaging With Dual-Branch U-Net Based on Deformable Convolution and Hyper-Convolution

Published:2024 Issue: Volume:73 Page:1-16
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Wang Zichen¹^ORCID,Li Xiuyan²^ORCID,Sun Yukuan³^ORCID,Wang Qi²^ORCID

Affiliation:

1. School of Electronic and Information Engineering, Tiangong University, Tianjin, China

2. School of Electronic and Information Engineering and Tianjin Key Laboratory of Optoelectronic Detection Technology and System, Tiangong University, Tianjin, China

3. Engineering Training Center, Tiangong University, Tianjin, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/19/10367905/10454092.pdf?arnumber=10454092

Reference64 articles.

1. Robust imaging using electrical impedance tomography: review of current tools

2. Application of Process Tomography to Multiphase Flow Measurement in Industrial and Biomedical Fields: A Review

3. The Research Progress of Electrical Impedance Tomography for Lung Monitoring

4. Advances in electrical impedance tomography-based brain imaging

5. Electrical Impedance Tomography: Tissue Properties to Image Measures

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