Characterization of power electronics system interconnect parasitics using time domain reflectometry-Reference-Cited by-同舟云学术

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Characterization of power electronics system interconnect parasitics using time domain reflectometry

Published:1999-07 Issue:4 Volume:14 Page:622-628
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Huibin Zhu ,Hefner A.R.,Lai J.-S.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/63/16805/00774198.pdf?arnumber=774198

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