An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs
Author:
Affiliation:
1. Universidad Pedagogica y Tecnologica de Colombia (UPTC),GIRA Research Group
2. Politecnico di Torino,Department of Control and Computer Engineering (DAUIN)
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10534343/10534590/10534609.pdf?arnumber=10534609
Reference16 articles.
1. Yield and Reliability Challenges at 7nm and Below
2. Reliability Challenges of Real-Time Systems in Forthcoming Technology Nodes
3. Silent Error Corruption: The New Reliability and Test Challenge
4. Detection and prevention of silent data corruption in an exabyte-scale database system;Bacon
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