Experimental Characterization of the RIGEL Sparse Readout ASIC for Soft X-Ray PixDD Detector-Reference-Cited by-同舟云学术

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Experimental Characterization of the RIGEL Sparse Readout ASIC for Soft X-Ray PixDD Detector

Published:2022-11-05 Issue: Volume: Page:1-3
ISSN:
Container-title:2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
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Author:

Dedolli Irisa¹,Mele Filippo¹,Ceraudo Francesco²,Gandola Massimo¹,Grassi Marco³,Bellutti Pierluigi⁴,Borghi Giacomo⁵,Campana Riccardo⁶,Caselle Michele⁷,Cirrincione Daniela⁸,Del Monte Ettore²,Evangelista Yuri²,Ficorella Francesco⁴,Fiorini Mauro⁹,Picciotto Antonino⁴,Rachevski Alexandre¹,Rashevskaya Irina⁸,Trifonova Ekaterina⁷,Zampa Gianluigi⁸,Zampa Nicola⁸,Zorzi Nicola⁴,Feroci Marco²,Vacchi Andrea¹⁰,Malcovati Piero³,Bertuccio Giuseppe¹

Affiliation:

1. Politecnico di Milano,Como,Italy,22100

2. INAF-IAPS,Rome,Italy,00133

3. University of Pavia,Pavia,Italy,27100

4. Fondazione Bruno Kessler,Trento,Italy,38123

5. FBK and is now With Politecnico di Milano,Milan,20133

6. INAF-OAS,Bologna,Italy,40127

7. Karlsruhe Institute of Technology,Karlsruhe,Germany,76131

8. INFN-Trieste

9. INAF,Milan,Italy,20133

10. University of Udine and With INFN-Trieste

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10398888/10398889/10399142.pdf?arnumber=10399142

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