Improving Planar Imaging for Semi-Pixelated Scintillation Crystals-Reference-Cited by-同舟云学术

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Improving Planar Imaging for Semi-Pixelated Scintillation Crystals

Published:2022-11-05 Issue: Volume: Page:1-5
ISSN:
Container-title:2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
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Author:

Nikolopoulou Fani¹,Kora Ioanna¹,Mikeli Maria²,Stiliaris Efstathios³

Affiliation:

1. National and Kapodistrian University of Athens,Department of Physics and the Medical School,Athens,Greece,GR-15771

2. National and Kapodistrian University of Athens,Department of Physics,Athens,Greece,GR-15771

3. National and Kapodistrian University of Athens and the Institute of Accelerating Systems and Applications (IASA),Department of Physics,Athens,Greece,GR-15771

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10398888/10398889/10399177.pdf?arnumber=10399177

Reference6 articles.

1. Depth of interaction determination in monolithic scintillator with double side SiPM readout

2. Four-layered DOI-PET detector with quadrisected top layer crystals

3. A correction method of the spatial distortion in planar images from γ-Camera systems

4. Barreloid Deformation Correction in Planar Imaging

5. Intercrystal Scatter Rejection for Pixelated PET Detectors

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