High-Dimensional Bayesian Optimization for Analog Integrated Circuit Sizing Based on Dropout and gm/ID Methodology
Author:
Affiliation:
1. Key Laboratory of Micro-Nano Electronics and System Integration of Xi’an City, Xi’an Jiaotong University, Xi’an, China
2. School of Information and Communication Engineering, Xi’an Jiaotong University, Xi’an, China
Funder
Joint Foundation of Key Laboratory of Shanghai Jiao Tong University-Xidian University, Ministry of Education
Department of Science and Technology of Shaanxi Province
China Electronics Technology Group Corporation, 24th Research Institute
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx7/43/9928799/09698107.pdf?arnumber=9698107
Reference40 articles.
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5. A review of feature selection methods based on mutual information
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