Achieving High MAP-Coverage Through Pattern Constraint Reduction-Reference-Cited by-同舟云学术

Achieving High MAP-Coverage Through Pattern Constraint Reduction

Published:2023-01-01 Issue:1 Volume:49 Page:99-112
ISSN:0098-5589
Container-title:IEEE Transactions on Software Engineering
language:
Short-container-title:IIEEE Trans. Software Eng.

Author:

Zhao Yingquan¹^ORCID,Wang Zan¹^ORCID,Liu Shuang¹^ORCID,Sun Jun²^ORCID,Chen Junjie¹^ORCID,Chen Xiang³^ORCID

Affiliation:

1. College of Intelligence and Computing, Tianjin University, Tianjin, China

2. School of Information Systems, Singapore Management University, Singapore

3. School of Information Science and Technology, Nantong University, Nantong, China

Funder

National Natural Science Foundation of China

Singapore Ministry of Education Research Found

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Software

Link

http://xplorestaging.ieee.org/ielx7/32/10008953/09689981.pdf?arnumber=9689981

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5. Efficient Detection of Thread Safety Violations via Coverage-Guided Generation of Concurrent Tests

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