Single- Versus Multi-Step Trap Assisted Tunneling Currents—Part II: The Role of Polarons
Author:
Affiliation:
1. Christian Doppler Laboratory for Single Defect Spectroscopy, Institute for Microelectronics, Technische Universität Wien, Vienna, Austria
2. Institute for Microelectronics, Technische Universität Wien, Vienna, Austria
3. imec, Leuven, Belgium
Funder
Austrian Federal Ministry for Digital and Economic Affairs, the National Foundation for Research, Technology and Development, and the Christian Doppler Research Association is gratefully acknowledged
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9839401/09829231.pdf?arnumber=9829231
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