Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks-Reference-Cited by-同舟云学术

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Outstanding Bit Error Tolerance of Resistive RAM-Based Binarized Neural Networks

Published:2019-03 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE International Conference on Artificial Intelligence Circuits and Systems (AICAS)
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Author:

Hirtzlin T.,Bocquet M.,Klein J.-O.,Nowak E.,Vianello E.,Portal J.-M.,Querlioz D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8766332/8771465/08771544.pdf?arnumber=8771544

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Error-Tolerance-Aware Write-Energy Reduction of MTJ-Based Quantized Neural Network Hardware;IEICE Transactions on Information and Systems;2024-08-01

2. Fully Binarized Graph Convolutional Network Accelerator Based on In‐Memory Computing with Resistive Random‐Access Memory;Advanced Intelligent Systems;2024-03-25

3. Powering AI at the edge: A robust, memristor-based binarized neural network with near-memory computing and miniaturized solar cell;Nature Communications;2024-01-25

4. Fully Digital, Standard-Cell-Based Multifunction Compute-in-Memory Arrays for Genome Sequencing;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-01

5. Error-Sensitivity-Aware Write-Energy Optimization for an MTJ-Based Binarized Neural Network;2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2023-12-04

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