A Learning-Based Framework for Locating Faults on Power Grid Lines Based on Distortion of Traveling Waves-Reference-Cited by-同舟云学术

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A Learning-Based Framework for Locating Faults on Power Grid Lines Based on Distortion of Traveling Waves

Published:2022 Issue: Volume:71 Page:1-15
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hamidi Shayan Mohajer¹^ORCID,Ameli Amir²^ORCID,Ghafouri Mohsen³^ORCID,Lopes Felipe V.⁴^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Canada

2. Department of Electrical Engineering, Lakehead University, Thunder Bay, Canada

3. Concordia Institute for Information Systems Engineering (CIISE), Concordia University, Montreal, Canada

4. Department of Electrical Engineering, Federal University of Paraíba (UFPB), João Pessoa, Paraíba, Brazil

Funder

Natural Sciences and Engineering Research Council of Canada

Lakehead University Startup Fund

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/9717300/09832929.pdf?arnumber=9832929

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel traveling wave fault location method for HVDC transmission line based on wavefront frequency;Electric Power Systems Research;2024-09

2. An Improved Bayesian Learning Method for Distribution Grid Fault Location and Meter Deployment Optimization;IEEE Transactions on Instrumentation and Measurement;2024

3. Induction Fault Traveling Wave Measurement Technique Based on Tunnel Magnetoresistance;IEEE Transactions on Power Delivery;2023-12

4. A visual faulty feeder detection method for power distribution network based on spatial image generation and deep learning;IET Generation, Transmission & Distribution;2023-11-20

5. Deep-Learning Based Power System Events Detection Technology Using Spatio-Temporal and Frequency Information;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2023-06

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