Author:
Guo Yuandong,Ouyang Muqi,Xu Zhifei,Kim Minho,Lee Junesang,Ha Jungrae,Lee Hyewon,Yun Sangwon,Fan Jun,Kim Hongseok
Cited by
1 articles.
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1. De-Embedding for Coupled Three-Port Devices;2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2022-09-01