Author:
Onoda S.,Hirao T.,Laird J.S.,Wakasa T.,Yamakawa T.,Okamoto T.,Koizumi Y.,Kamiya T.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
2 articles.
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1. Transient current mapping obtained from silicon photodiodes using focused ion microbeams with several hundreds of MeV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-06
2. Analysis of transient ion beam induced current in Si PIN photodiode;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04