A Digital Gate Driver IC with Active Gate Waveform Calibration Technique Achieving Switching Loss Reduction by 24% and DESAT Turn-off Arbitrary Waveform Memory for Overcurrent Protection Targeting 1200V SiC MOSFETs
Author:
Affiliation:
1. Toshiba Corporation,Corporate Research and Development Center,Kawasaki,Japan
2. Toshiba Europe Limited,Bristol Research and Innovation Laboratory,Bristol,UK
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10361838/10361943/10362369.pdf?arnumber=10362369
Reference5 articles.
1. Full Custom Design of an Arbitrary Waveform Gate Driver With 10-GHz Waypoint Rates for GaN FETs
2. An Active Slew Rate Control Gate Driver IC With Robust Discrete-Time Feedback Technique for 600-V Superjunction MOSFETs
3. 33.2 A 600V GaN Active Gate Driver with Dynamic Feedback Delay Compensation Technique Achieving 22.5% Turn-On Energy Saving
4. General-Purpose Clocked Gate Driver IC With Programmable 63-Level Drivability to Optimize Overshoot and Energy Loss in Switching by a Simulated Annealing Algorithm
5. A Load Adaptive Digital Gate Driver IC With Integrated 500 ksps ADC for Drive Pattern Selection and Functional Safety Targeting Dependable SiC Application
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1. A Digital Gate Driver IC with a Digitally Adjustable DESAT and Parameter Adjustment Method for False Detection Prevention and Short-Circuit Protection of 1200V 180A SiC Module;2024 IEEE Applied Power Electronics Conference and Exposition (APEC);2024-02-25
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