Positive and negative bias temperature instability on sub-nanometer eot high-K MOSFETs-Reference-Cited by-同舟云学术

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Positive and negative bias temperature instability on sub-nanometer eot high-K MOSFETs

Published:2010-05 Issue: Volume: Page:
ISSN:
Container-title:2010 IEEE International Reliability Physics Symposium
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Author:

Cho Moonju,Aoulaiche Marc,Degraeve Robin,Kaczer Ben,Franco Jacopo,Kauerauf Thomas,Roussel Philippe,Ragnarsson Lars A.,Tseng Joshua,Hoffmann Thomas Y.,Groeseneken Guido

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5482567/5488659/05488667.pdf?arnumber=5488667

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