The Generalized Inflection S-Shaped Software Reliability Growth Model
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/9023405/08491327.pdf?arnumber=8491327
Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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5. Nonhomogeneous Markov Process Modeling for Software Reliability Assessment;IEEE Transactions on Reliability;2023-12
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