Some Aging Properties of the Residual Life of<tex>$k$</tex>-out-of-<tex>$n$</tex>Systems-Reference-Cited by-同舟云学术

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Some Aging Properties of the Residual Life of$k$-out-of-$n$Systems

Published:2006-09 Issue:3 Volume:55 Page:535-541
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:en
Short-container-title:IEEE Trans. Rel.

Author:

Li X.,Zhao P.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/35614/01688090.pdf?arnumber=1688090

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