Stress, microstructure and materials reliability of sputter-deposited Fe-N films
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx1/20/7861/00333944.pdf?arnumber=333944
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Materials by design: Effect of deposition temperature on the magnetic properties of FeZrN;Physica B: Condensed Matter;2007-04
2. Structure, properties, and thermal stability of nanocrystallite Fe-Ti-N soft magnetic films;IEEE Transactions on Magnetics;2003-11
3. Microstructural characterization of Fe–N thin films;Thin Solid Films;2002-05
4. The structure and magnetic properties of Fe- N thin films;Science China Mathematics;2002-02
5. Magnetically soft and electrically resistive CoNiFeS alloy films prepared by electrodeposition;Journal of Applied Physics;2000-05
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