High-Resolution UHF Near-Field Imaging Probe-Reference-Cited by-同舟云学术

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High-Resolution UHF Near-Field Imaging Probe

Published:2018-10 Issue:10 Volume:67 Page:2353-2362
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Abou-Khousa Mohamed A.^ORCID,Muhammed Shafi K. T.,Xingyu Xie

Funder

ADEK Award for Research Excellence (A2RE) 2015, Department of Education and Knowledge, Abu-Dhabi, UAE

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/8467399/08338116.pdf?arnumber=8338116

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