Measurement of Microwave Substrates Complex Permittivity with Distribution Uniformity (Invited)-Reference-Cited by-同舟云学术

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Measurement of Microwave Substrates Complex Permittivity with Distribution Uniformity (Invited)

Published:2023-11-22 Issue: Volume: Page:1-2
ISSN:
Container-title:2023 IEEE 11th Asia-Pacific Conference on Antennas and Propagation (APCAP)
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Author:

Chen Jiahui¹,Ravelo Blaise¹,Wan Fayu¹,Gao Zhiliang²,Yang Ming²,Yan Feng²

Affiliation:

1. Nanjing University of Information Science & Technology,Nanjing,China,210044

2. Beijing Orient Institute for Measurement & Test,Beijing,China,10086

Funder

National Key Research and Development Program of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10468570/10469676/10470107.pdf?arnumber=10470107

Reference4 articles.

1. Complex Dielectric Constant Extraction of Substrate Materials Using Cross-Resonator Method

2. A Transmission-Reflection Method for Complex Permittivity Measurement Using a Planar Sensor

3. Measurement techniques in microstrip

4. Microwave Engineering

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