Die to Wafer Hybrid Bonding for Chiplet and Heterogeneous Integration: Die Size Effects Evaluation-Small Die Applications
Author:
Affiliation:
1. Adeia,San Jose,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9816066/9816372/09816427.pdf?arnumber=9816427
Reference21 articles.
1. Development of Low Temperature Direct Bond Interconnect Technology for Die-To-Wafer and Die-To-Die Applications-Stacking, Yield Improvement, Reliability Assessment
2. Low Temperature Cu Interconnect with Chip to Wafer Hybrid Bonding
3. Chip to Wafer Hybrid Bonding with Cu Interconnect: High Volume Manufacturing Process Compatibility Study
4. Cu interconnect scaling with hybrid bonding for 2.5 and 3D integration;workman;IMAPS Device Packaging Conference,2020
5. Die to Wafer Stacking with Low Temperature Hybrid Bonding
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1. Advancing Fine Pitch (< 5μm) Interconnects through Self-Aligned Die-to-Wafer Hybrid Bonding for Chiplet Integration;2023 IEEE 25th Electronics Packaging Technology Conference (EPTC);2023-12-05
2. Assembly process characterization of 3D Stacking of Heterogeneous Chiplets;2023 IEEE 25th Electronics Packaging Technology Conference (EPTC);2023-12-05
3. Multi-Product Optimization for 3D Heterogeneous Integration with D2W Bonding;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
4. Toward monolithic growth integration of nanowire electronics in 3D architecture: a review;Science China Information Sciences;2023-09-06
5. Surface Protecting and Particles Removing after Wafer Sawing for Die-to-wafer Hybrid Bonding;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08
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