Deep and Weak Ultraviolet Photodetection on Micro-Nano Textured Black Silicon With Al<sub>2</sub>O<sub>3</sub> Film-Reference-Cited by-同舟云学术

Deep and Weak Ultraviolet Photodetection on Micro-Nano Textured Black Silicon With Al₂O₃ Film

Published:2024-06-15 Issue:12 Volume:24 Page:19013-19020
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Zhao Zhou¹,Wang Yonghua¹,Zhang Yijun²,Liu Dan¹^ORCID,Zhang Zengxing³^ORCID,Xue Chenyang¹^ORCID

Affiliation:

1. Key Laboratory of Instrumentation Science and Dynamic Measurement, Ministry of Education, North University of China, Taiyuan, China

2. Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, China

3. Pen-Tung Sah Institute of Micro-Nano Science and Technology, Xiamen University, Xiamen, China

Funder

National Natural Science Foundation of China

Applied basic Research Project of Shanxi Province

Fundamental Research Program of Shanxi Province

Key Research and Development Plan of Hainan Province

Xiamen University President’s Fund

Xiamen Marine Development Bureau Project

Tan Kah Kee Innovation Laboratory

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/7361/10558706/10516301.pdf?arnumber=10516301

Reference45 articles.

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4. Crystal growth and fluorescence of downconversion films in confined space with ingoing channels

5. A Dual‐Gate InGaZnO 4 ‐Based Thin‐Film Transistor for High‐Sensitivity UV Detection