Vertical CdTe:PVP/<i>p</i>-Si-Based Temperature Sensor by Using Aluminum Anode Schottky Contact-Reference-Cited by-同舟云学术

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Vertical CdTe:PVP/p-Si-Based Temperature Sensor by Using Aluminum Anode Schottky Contact

Published:2022-12-01 Issue:23 Volume:22 Page:22391-22397
ISSN:1530-437X
Container-title:IEEE Sensors Journal
language:
Short-container-title:IEEE Sensors J.

Author:

Cetinkaya Hayriye Gokcen¹^ORCID,Cicek Osman²^ORCID,Altindal Semsettin³,Badali Yosef⁴,Demirezen Selcuk⁵^ORCID

Affiliation:

1. Vocational School of Health Services, Gazi University, Ankara, Turkey

2. Electrical-Electronic Engineering Department, Kastamonu University, Kastamonu, Turkey

3. Physics Department, Gazi University, Ankara, Turkey

4. Department of Computer Engineering, Istanbul Ticaret University, Istanbul, Turkey

5. Sabuncuoğlu Serefeddin Vocational School of Health Services, Amasya University, Amasya, Turkey

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/7361/9966666/09918658.pdf?arnumber=9918658

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A high sensitivity temperature coefficient of the Au/n-Si with (CdTe-PVA) structure based on capacitance/conductance-voltage (C/G-V) measurements in a wide range of temperature;Measurement;2024-10

2. Multi-Gaussian distribution of barrier height in diamond-like carbon interfacial-layered Schottky devices;Materials Science in Semiconductor Processing;2024-07

3. The Role of Co/Zn-Doped Organic Interlayer on the Operating Performance of Schottky Devices as an Ionizing Radiation Sensor;IEEE Sensors Journal;2024-06-01

4. The study of the dependence of dielectric properties, electric modulus, and ac conductivity on the frequency and voltage in the Au/(CdTe:PVA)/n-Si (MPS) structures;Journal of Materials Science: Materials in Electronics;2024-06

5. Artificial multisensory system with optical feedback for multimodal perceptual imaging;Chemical Engineering Journal;2024-05

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